Indicative Project

​Nanotechnology relies on our ability to characterise, understand and manipulate matter at the nanometre scale. The Atomic Force Microscope (AFM) is an enabling tool for all of these fundamental tasks.

NMI’s scanning probe microscopy laboratory develops and maintains unique state-of-the-art AFM instrumentation and methodology for measurements of dimensions of nanoscale objects that are traceable to the SI metre. This traceability ensures that measurements are comparable to each other and give industry and researchers confidence in the accuracy of the results.

The requirements for ultimate accuracy of nanoscale measurements place very high demands on the performance of the AFM instrumentation, and NMI is developing unique solutions to meet these demands, including an ultra-stable metrological  canning Probe Microscope (mSPM).